QJ 2189-1991 晶体振荡器总规范
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基本信息
| 标准名称： | 晶体振荡器总规范 |
| 中标分类： | 航空、航天 >> 航空器与航天器零部件 >> 电子元器件 |
| 发布日期： | |
| 实施日期： | 1991-10-01 |
| 首发日期： | |
| 作废日期： | |
| 出版日期： |
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前言
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目录
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引用标准
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所属分类： 航空 航天 航空器与航天器零部件 电子元器件
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基本信息
| 标准名称： | Ｊ２－１０、２０型插座用衬垫 |
| 发布日期： | 1982-01-01 |
| 实施日期： | 1982-01-01 |
| 首发日期： | |
| 作废日期： | 1995-04-21 |
| 出版日期： | |
| 页数： | 1页 |
适用范围
没有内容
前言
没有内容
目录
没有内容
引用标准
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所属分类： 航空 航天 航空器与航天器零部件 机械配件 构件 航空器和航天器工程 航空航天用零部件
【英文标准名称】:StandardPracticeforAnalyticallyDescribingDepth-ProfileandLinescan-ProfileDatabyanExtendedLogisticFunction【原文标准名称】:用扩展的逻辑函数描述深度剖面和行扫描剖面数据的标准实施规程
【标准号】:ASTME1636-2010
【标准状态】:现行
【国别】:美国
【发布日期】:2010
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.08
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:
【英文主题词】:depth-profileinterfacedata;linescaninterfacedata;logisticfunction;Compositionanalysis--metals/alloys;Extendedlogisticfunction;Interfaceprofileanalysis;Logisticfunction;SIMS(secondaryionmassspectrometry);Sputterdepthprofilingdata
【摘要】:Informationoninterfacecompositionisfrequentlyobtainedbymeasuringsurfacecompositionwhilethespecimenmaterialisgraduallyremovedbyionbombardment(seeGuideE1127andPracticeE1162).Inthisway,interfacesarerevealedandcharacterizedbythemeasurementofcompositionversusdepthtoobtainasputter-depthprofile.Theshapeofsuchinterfaceprofilescontainsinformationaboutthephysicalandchemicalpropertiesoftheinterfaceregion.Inordertoaccuratelyandunambiguouslydescribethisinterfaceregionandtodetermineitswidth(seeGuideE1438),itishelpfultodefinetheshapeoftheentireinterfaceprofilewithasingleanalyticfunction.Interfacesindepthprofilesfromonesemi-infinitemediumtoanothergenerallyhaveasigmoidalshapecharacteristicofthecumulativelogisticdistribution.Useofsuchalogisticfunctionisphysicallyappropriateandissuperiortootherfunctions(forexample,polynomials)thathaveheretoforebeenusedforinterface-profileanalysisinthatitcontainstheminimumnumberofparametersfordescribinginterfaceshapes.Measurementsofvariationsinsignalintensityorsurfacecompositionasafunctionofpositiononasurfacegiveinformationontheshapeofasteportopographicfeatureonasurfaceoronthesharpnessofaninterfaceataphaseboundary.Theshapesofstepsorotherfeaturesonasurfacecangiveinformationonthelateralresolutionofasurface-analysistechniqueifthesamplebeingmeasuredhassufficientlysharpedges(seeISO18516).Similarly,theshapesofcompositionalvariationsacrossasurfacecangiveinformationonthephysicalandchemicalpropertiesoftheinterfaceregion(forexample,theextentofmixingordiffusionacrosstheinterface).Itisconvenientintheseapplicationstodescribethemeasuredlinescanprofilewithanappropriateanalyticfunction.Althoughthelogisticdistributionisnottheonlyfunctionthatcouldbeusedtodescribemeasuredlinescans,itisphysicallyplausibleandithastheminimumnumberofparametersfordescribingsuchlinescans.Manyattemptshavebeenmadetocharacterizeinterfaceprofileswithgeneralfunctions(suchaspolynomialsorerrorfunctions)butthesehavesufferedfrominstabilitiesandaninabilitytohandlepoorlystructureddata.Choiceofthelogisticfunctionalongwithaspecificallywrittenleast-squaresprocedure(describedinAppendixX1)canprovidestatisticallyevaluatedparametersthatdescribethewidth,asymmetry,anddepthofinterfaceprofilesorlinescansinareproducibleandunambiguousway.1.1Thispracticedescribesasystematicmethodforanalyzingdepth-profileandlinescandataandforaccuratelycharacterizingtheshapeofaninterfaceregionortopographicfeature.Theprofiledataaredescribedwithanappropriateanalyticfunction,andtheparametersofthisfunctiondefinetheposition,width,andanyasymmetryoftheinterfaceorfeature.Theuseofthispracticeisrecommendedinorderthattheshapesofcompositionprofilesofinterfacesoroflinescansoftopographicfeaturesacquiredwithdifferentinstrumentsortechniquescanbeunambiguouslycomparedandinterpreted.1.2Thispracticeisintendedtobeusedfortwopurposes.First,itcanbeusedtodescribetheshapeofdepth-profilesobtainedataninterfacebetweentwodissimilarmaterialsthatmightbemeasuredbycommonsurface-analysistechniquessuchasAugerelectronspectroscopy,secondary-ionmassspectrometry,andX-rayphotoelectronspectroscopy.Second,itcanbeusedtodescribeth......
【中国标准分类号】:A41
【国际标准分类号】:71_040_50
【页数】:8P.;A4
【正文语种】:英语
